The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2011

Filed:

Jun. 29, 2007
Applicants:

Masahiro Ikadai, Tokyo, JP;

Hirohiko Iwase, Tokyo, JP;

Naoki Kinugasa, Tokyo, JP;

Inventors:

Masahiro Ikadai, Tokyo, JP;

Hirohiko Iwase, Tokyo, JP;

Naoki Kinugasa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1333 (2006.01); G02F 1/1335 (2006.01); G03B 21/56 (2006.01); G03B 21/28 (2006.01); G02B 5/08 (2006.01); C09K 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A glass substrate for a reflective mirror of a rear projection television (RPTV) which ensures display quality by quantitative control, and can reduce control cost and manufacture cost is provided. A reflective mirrorof the rear projection television (RPTV) includes a float glass plate (glass substrate)formed to have a plate thickness of 3 mm by a float process, and a reflection enhancing filmconstituted of aluminum (Al) formed on one surfaceof the glass substrateby a sputtering method. In the measurement condition of a cut-off value of 0.8 to 8 mm, the maximum amplitude of a filtered waviness curve is 0.1 μm or less, the maximum value of a viewability index value γ (=A/D) in a range of spatial frequencies 2 to 500/mm by spectral analysis of the filtered waviness curve is 0.02 (/m) or less, and an integral value of the viewability index value γ is 2.0 (/m) or less.


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