The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2011
Filed:
Sep. 02, 2008
Russell Granneman, Goleta, CA (US);
Nuwan Nagahawatte, Goleta, CA (US);
Richard M. Goeden, Goleta, CA (US);
Ted Takagi, Santa Maria, CA (US);
Robert Ernst, Carpinteria, CA (US);
Gary B. Hughes, Santa Maria, CA (US);
Joseph Kostrzewa, Buellton, CA (US);
John Graff, Santa Barbara, CA (US);
George Speake, Santa Barbara, CA (US);
Michael Kent, Goleta, CA (US);
Neela Nalam, Goleta, CA (US);
Stephen Lyon, Goleta, CA (US);
Barbara Sharp, Santa Barbara, CA (US);
Pierre Boulanger, Goleta, CA (US);
Neil Cutcliffe, Goleta, CA (US);
Tim Martin, Santa Barbara, CA (US);
Ted Hoelter, Goleta, CA (US);
Russell Granneman, Goleta, CA (US);
Nuwan Nagahawatte, Goleta, CA (US);
Richard M. Goeden, Goleta, CA (US);
Ted Takagi, Santa Maria, CA (US);
Robert Ernst, Carpinteria, CA (US);
Gary B. Hughes, Santa Maria, CA (US);
Joseph Kostrzewa, Buellton, CA (US);
John Graff, Santa Barbara, CA (US);
George Speake, Santa Barbara, CA (US);
Michael Kent, Goleta, CA (US);
Neela Nalam, Goleta, CA (US);
Stephen Lyon, Goleta, CA (US);
Barbara Sharp, Santa Barbara, CA (US);
Pierre Boulanger, Goleta, CA (US);
Neil Cutcliffe, Goleta, CA (US);
Tim Martin, Santa Barbara, CA (US);
Ted Hoelter, Goleta, CA (US);
Flir Systems, Inc., Wilsonville, OR (US);
Abstract
Systems and methods directed to calibration techniques for infrared cameras are disclosed. For example, a method of obtaining calibration information for an infrared device includes providing a calibration target adapted to provide a low-emissivity scene; performing a calibration operation on the infrared device to obtain the calibration information; and storing the calibration information.