The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2011

Filed:

Jun. 17, 2010
Applicants:

Keiji Koyama, Osaka, JP;

Tetsuya Kuwabara, Osaka, JP;

Masaru Haga, Osaka, JP;

Hideki Kashihara, Osaka, JP;

Inventors:

Keiji Koyama, Osaka, JP;

Tetsuya Kuwabara, Osaka, JP;

Masaru Haga, Osaka, JP;

Hideki Kashihara, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B07C 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A grain classifying device for accurately classifying the grains of uniform length, and an adhesive containing grains classified by the device and capable of connecting electrodes under a low pressure and being applicable to electrodes arranged in fine pitches. The grain classifying device () includes a dispersing means () for dispersing a plurality of grains (P). A grain orienting means () orients each of the dispersed grains in a transfer direction (X) of the grains (P) while spacing the grains apart from one another in the transfer direction (X) of the grains. A grain length measuring means () measures the length of each of the grains (P) oriented in the transfer direction (X). A grain separation means () separates the grains (P) having a predetermined length based on data related to the lengths of the measured grains (P).


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