The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2011

Filed:

Apr. 14, 2009
Applicant:

Victor B. Kley, Berkeley, CA (US);

Inventor:

Victor B. Kley, Berkeley, CA (US);

Assignee:

General Nanotechnology LLC, Berkeley, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 70/14 (2010.01);
U.S. Cl.
CPC ...
Abstract

An instrument includes a probe having a porous tip, a tip positioning apparatus to position the tip with respect to a sample material, a probe positioning apparatus to position the probe and sample material with respect to each other, and a controller. The controller controls the probe positioning apparatus in positioning the probe over the sample and controls the tip positioning apparatus in lowering the tip into the sample material to produce an interaction between the porous tip and the sample material.


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