The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2011
Filed:
Aug. 08, 2007
Jongseung Park, Allentown, PA (US);
Andrei E. Vityaev, San Jose, CA (US);
LI Du, Broomfield, CO (US);
Jongseung Park, Allentown, PA (US);
Andrei E. Vityaev, San Jose, CA (US);
Li Du, Broomfield, CO (US);
LSI Corporation, Milpitas, CA (US);
Abstract
A method of double detection in a perpendicular magnetic read channel is disclosed. The method generally includes the steps of (A) generating an intermediate signal by performing a first detection on an input signal of the perpendicular read channel, the first detection having a first error rate, (B) generating a statistics signal based on the intermediate signal, the statistics signal conveying noise statistics that depend on data in the input signal and (C) generating an output signal by performing a second detection on the input signal using the noise statistics to reduce a second error rate of the second detection compared with the first error rate, wherein the first detection is independent of the second detection.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile