The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2011
Filed:
Feb. 15, 2011
Built-in self-test using embedded memory and processor in an application specific integrated circuit
Richard D. Taylor, Eagle, ID (US);
Mark D. Montierth, Meridian, ID (US);
Melvin D. Bodily, Boise, ID (US);
Gary D. Zimmerman, Boise, ID (US);
John D. Marshall, Boise, ID (US);
Richard D. Taylor, Eagle, ID (US);
Mark D. Montierth, Meridian, ID (US);
Melvin D. Bodily, Boise, ID (US);
Gary D. Zimmerman, Boise, ID (US);
John D. Marshall, Boise, ID (US);
Marvell International Tecnology Ltd., Hamilton, BM;
Abstract
A test method for an ASIC uses an embedded processor in the ASIC to execute test routines from an embedded memory or an external memory. During ASIC production, the test routines can comprehensively test of the blocks of the ASIC without a complicated test pattern from test equipment. The test routines can also perform power-up tests in systems or end products containing the ASIC. Test selection, activation, and result output can be implement using a few terminals of the ASIC.