The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2011
Filed:
Jun. 20, 2008
Applicants:
David Wald, Watertown, MA (US);
Tim Wakeling, Andover, MA (US);
Muhammad Arshad Khan, Sharon, MA (US);
Inventors:
David Wald, Watertown, MA (US);
Tim Wakeling, Andover, MA (US);
Muhammad Arshad Khan, Sharon, MA (US);
Assignee:
Ab Initio Technology LLC, Lexington, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
In general, a method includes determining metric values associated with data quality for one or more child nodes. Metric values are determined for a parent node based on the metric values of at least some of the child nodes, and relationships between one or more parent nodes and one or more child nodes define a hierarchy. The determination of the metric value for the parent node is repeated for multiple instances.