The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2011
Filed:
Jun. 20, 2008
Jeffrey G. Renfro, Deer Park, TX (US);
Joseph Z. LU, Glendale, AZ (US);
Jeffrey G. Renfro, Deer Park, TX (US);
Joseph Z. Lu, Glendale, AZ (US);
Honeywell International Inc., Morristown, NJ (US);
Abstract
A method includes obtaining a nonlinear process model modeling a nonlinear process to be controlled. The method also includes obtaining an objective function defining how the process is controlled. The method further includes obtaining a control model defining a dynamic feasible region associated with a controlled variable, where the controlled variable is associated with the process. In addition, the method includes controlling the nonlinear process by solving a control problem that includes the process model, control model, and objective function. The dynamic feasible region defined by the control model could represent a funnel region. The objective function could include terms for minimizing and optimizing adjustments to one or more manipulated variables associated with the process. Controlling the nonlinear process could include performing simultaneous control and optimization, where adjustments to the one or more manipulated variables are chosen to meet the control objectives and possibly to optimize and minimize the adjustments.