The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2011
Filed:
Nov. 19, 2007
Hubert Lettenbauer, Unterkochen, DE;
Andreas Lotze, Dresden, DE;
Steffen Kunzmann, Dresden, DE;
Carl Zeiss Industrielle Messtechnik GmbH, Oberkocken, DE;
Abstract
A method and a device determine material interfaces in a test object. The novel method generates three-dimensional image data of the test object or uses already existing three-dimensional image data of the test object. Image values of the image data are, or were, obtained by invasive radiation. An evaluation line for evaluating the image data relative to the test object is determined, a location of a material interface of the test object is determined by evaluating the image data of image values along the evaluation line so that the value of the first partial derivative of the image values in the direction of the evaluation line has a local maximum at the location of the material interface.