The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8045791 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 25, 2011

Filed:

Nov. 19, 2007
Applicants:

Chih-kuang Chang, Taipei Hsien, TW;

Xiao-chao Sun, Shenzhen, CN;

Zhong-kui Yuan, Shenzhen, CN;

Inventors:

Chih-Kuang Chang, Taipei Hsien, TW;

Xiao-Chao Sun, Shenzhen, CN;

Zhong-Kui Yuan, Shenzhen, CN;

Assignees:

Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;

Hon Hai Precision Industry Co., Ltd., Tu-Cheng, New Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method measures digital images of a workpiece using a measuring computer and a client computer. The measuring computer reads each of the digital images of the workpiece from a source file, and merges all the images to generate a combined image of the workpiece. An object to be measured is selected from the combined image, and an image of the selected object is extracted from the combined image. The client computer measures the selected object on the extracted image, and displays measuring results of the selected object.


Find Patent Forward Citations

Chang, Chih-Kuang. (2011). System and method for measuring digital images of a workpiece (U.S. Patent No. 8045791). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8045791

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