The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2011

Filed:

Jul. 09, 2008
Applicants:

Satoru Nakanishi, Utsunomiya, JP;

Naruomi Akino, Nasushiobara, JP;

Inventors:

Satoru Nakanishi, Utsunomiya, JP;

Naruomi Akino, Nasushiobara, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An X-ray computed tomography apparatus scans a subject to be examined with cone beam X-rays, and generates reference volume data on the basis of projection data. This apparatus extracts a cone beam artifact component contained in the reference volume data on the basis of the typical shape and direction of the cone beam artifact component. This apparatus generates resultant volume data with the reduced cone beam artifact by subtracting the cone beam artifact component from the reference volume data.


Find Patent Forward Citations

Nakanishi, Satoru. (2011). X-ray computed tomography apparatus, reconstruction processing apparatus, and image processing apparatus (U.S. Patent No. 8045781). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8045781

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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