The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2011

Filed:

Jul. 13, 2007
Applicants:

Anthony P. Reeves, Ithaca, NY (US);

William J. Kostis, Warren, NJ (US);

Claudia Henschke, New York, NY (US);

David Yankelevitz, Brooklyn, NY (US);

Inventors:

Anthony P. Reeves, Ithaca, NY (US);

William J. Kostis, Warren, NJ (US);

Claudia Henschke, New York, NY (US);

David Yankelevitz, Brooklyn, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to methods and systems for conducting three-dimensional image analysis and diagnosis and possible treatment relating thereto. The invention includes methods of handling signals containing information (data) relating to three-dimensional representation of objects scanned by a scanning medium. The invention also includes methods of making and analyzing volumetric measurements and changes in volumetric measurements which can be used for the purpose of diagnosis and treatment.


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