The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2011
Filed:
Jun. 04, 2008
Applicants:
Masanori Kobayashi, Yokohama, JP;
Hiroyoshi Funato, Chigasaki, JP;
Kazuya Miyagaki, Yokohama, JP;
Inventors:
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
Abstract
An optical scanning device including a light source, a deflection device to deflect a light beam from the light source, an image focus optical system to focus the light beam deflected by the deflection device on a scanned surface to form an image thereon and scan a surface by the light beam deflected by deflection device to form an image thereon, a light path switching device provided between the light source and the deflection device, which switches a light path of the light beam emitted from the light source to deflect the light beam on different timings such that the light beam scans different surfaces.