The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2011
Filed:
Dec. 02, 2008
Stephen James Hardy, West Pymble, AU;
Deqiang Eugene Cai, Brighton-Le-Sands, AU;
Stephen James Hardy, West Pymble, AU;
DeQiang Eugene Cai, Brighton-Le-Sands, AU;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
Methods () of determining a light scattering property of a medium (), are disclosed. The medium () is illuminated through a test pattern (e.g.,), the test pattern () comprising at least one region containing a first pattern with substantial variation in two orthogonal directions at one scale. The test pattern () further comprises at least one other region containing the first pattern at a different scale. The light reflected from the illuminated medium () through the test pattern is measured to capture an image of the illuminated medium. A light scattering property of the medium () is determined based on the measured light.