The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2011
Filed:
Oct. 23, 2006
Daniel N. Harres, Belleville, IL (US);
Daniel N. Harres, Belleville, IL (US);
The Boeing Company, Chicago, IL (US);
Abstract
An apparatus to measure optical characteristics of an optical medium may include an optical source to generate an optical square wave for transmission into the optical medium and an optical receiver to receive a reflected optical waveform from the optical medium caused by a portion of the optical square wave being reflected by any anomaly in the optical medium. The optical receiver may convert the reflected optical waveform to a reflected electrical waveform. The apparatus may also include a module to combine the reflected electrical waveform with a reference waveform to form a resulting waveform. The reference waveform may correspond substantially to the optical square wave and may be delayed a predetermined time duration. A controller may be included to process the resulting waveform to detect any anomaly and a location of the anomaly in the optical medium based on an amplitude of the resulting waveform at a sample delay position in the resulting waveform.