The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2011

Filed:

May. 08, 2007
Applicants:

Yoichiro Handa, Tokyo, JP;

Satoru Nishiuma, Kawasaki, JP;

Inventors:

Yoichiro Handa, Tokyo, JP;

Satoru Nishiuma, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 21/55 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a detecting element which can stably detect a substance with high sensitivity; a detecting device therefor; and a detecting method therefor. The detecting element and the detecting device according to the present invention have a plurality of planes having a plurality of mutually-separated metallic structures arranged thereon. The detecting method according to the present invention includes making a detecting light irradiate the detecting element so that the light can intersect a plurality of the planes. Thereby, the detecting light is more frequently absorbed in the vicinity of the metallic structure and the detecting device can stably detect a slight change of a spectrum originating from a trace change of a refractive index occurring in the vicinity of the metallic structure, with the high sensitivity.


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