The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2011

Filed:

Dec. 10, 2004
Applicants:

Masaaki Kurebayashi, Shizuoka, JP;

Mikiko Mase, Aichi, JP;

Hiroyuki Hasegawa, Tokyo, JP;

Hideki Hama, Tokyo, JP;

Inventors:

Masaaki Kurebayashi, Shizuoka, JP;

Mikiko Mase, Aichi, JP;

Hiroyuki Hasegawa, Tokyo, JP;

Hideki Hama, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/00 (2011.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method to monitor a target area of a panoramic images by shooting the target area, sequentially shifting the shooting direction. A unit image of a generated panoramic image and a corresponding unit image of another panoramic image generated before the first panoramic image are compared and the change, if any, in the luminance level is detected. Then, the detected difference of luminance level is compared with a predetermined threshold value and predetermined information is displayed on the display screen with the generated panoramic image. It is possible to define small regions in the area for which a large threshold is predetermined and/or small regions in the area for which no such comparison is made on a unit image basis.


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