The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2011
Filed:
Jan. 18, 2008
Applicants:
Volker Dreyer, Lörrach, DE;
Armin Wernet, Rheinfelden, DE;
Roland Dieterle, Lörrach, DE;
Inventors:
Assignee:
Endress + Hauser GmbH + Co. KG, Maulburg, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for servicing, especially checking, an apparatus for capacitive ascertaining and/or monitoring at least one process variable of a medium, wherein the apparatus has at least one probe unit with a probe electrode and an auxiliary electrode. The probe electrode and/or the auxiliary electrode are/is supplied at least with one test signal or connected with at least one electrical potential, that at least one response signal is tapped from the probe unit, and that, at least from the response signal and a predeterminable desired value, information is obtained concerning the apparatus.