The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2011
Filed:
Sep. 03, 2009
Applicants:
Lee D. Feinberg, Silver Spring, MD (US);
Bruce H. Dean, New Market, MD (US);
Tristram T. Hyde, Severna Park, MD (US);
Inventors:
Lee D. Feinberg, Silver Spring, MD (US);
Bruce H. Dean, New Market, MD (US);
Tristram T. Hyde, Severna Park, MD (US);
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/20 (2006.01);
U.S. Cl.
CPC ...
Abstract
According to various embodiments, provided herein is an optical system and method that can be configured to perform image analysis. The optical system can comprise a telescope assembly and one or more hybrid instruments. The one or more hybrid instruments can be configured to receive image data from the telescope assembly and perform a fine guidance operation and a wavefront sensing operation, simultaneously, on the image data received from the telescope assembly.