The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2011
Filed:
Jul. 10, 2007
Applicants:
John H. Reif, Durham, NC (US);
Peng Yin, Pasadena, CA (US);
Thomas H. Labean, Hillsborough, NC (US);
Geetha Shetty, Cary, NC (US);
Erik A. Schultes, Durham, NC (US);
Inventors:
John H. Reif, Durham, NC (US);
Peng Yin, Pasadena, CA (US);
Thomas H. Labean, Hillsborough, NC (US);
Geetha Shetty, Cary, NC (US);
Erik A. Schultes, Durham, NC (US);
Assignee:
Eagle Eye Research, Inc., Durham, NC (US);
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); C07H 21/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
Compositions and methods for detecting the presence of analytes employing autocatalytic chain reactions (ACR) having super linear kinetics for amplification of signal are disclosed.
Quick Actions:
Reif, John. (2011). Analyte detection using autocatalytic chain reactions (U.S. Patent No. 8043810). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8043810
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile