The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2011
Filed:
Jan. 22, 2008
Seok Jung Hyun, Seoul, KR;
Kyung Hoo Moon, Seoul, KR;
Kyu Sik Yun, Seoul, KR;
Yeon Jae Kang, Seoul, KR;
Guei Sam Lim, Seoul, KR;
Gyoung Soo Kim, Seoul, KR;
Seok Jung Hyun, Seoul, KR;
Kyung Hoo Moon, Seoul, KR;
Kyu Sik Yun, Seoul, KR;
Yeon Jae Kang, Seoul, KR;
Guei Sam Lim, Seoul, KR;
Gyoung Soo Kim, Seoul, KR;
LG Electronics Inc., Seoul, KR;
Abstract
The multi-layer strip for use in measuring biological material and the system for measuring a biological material are provided, wherein the multi-layer strip includes a stack of a plurality of strips, each having a flow channel and a reaction unit, and the strips may react with specific materials contained in a biological material injected into the multi-layer strip. Thus, it is possible to quantitatively analyze various materials contained in a biological material and to optically and electrochemically measure and quantitatively analyze various materials in a biological material.