The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2011

Filed:

Dec. 22, 2008
Applicants:

Hua Peng, Beijing, CN;

Jianhua Liu, Beijing, CN;

Yangtian Zhang, Beijing, CN;

Zhongxia Zhang, Beijing, CN;

Wei Chen, Beijing, CN;

Inventors:

Hua Peng, Beijing, CN;

Jianhua Liu, Beijing, CN;

Yangtian Zhang, Beijing, CN;

Zhongxia Zhang, Beijing, CN;

Wei Chen, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A wipe sampling assembly used for an ion mobility spectrometer is disclosed. The wipe sampling assembly comprises three layers in which the upper layer and the lower layer are protective paper sheets, while the middle layer is a sampling swab. The swab will not be contaminated when not in use as it is covered by the two protective paper sheets. The hand can only contact the protective paper and will not contact the swab while sampling to prevent the swab from being contaminated. The above wipe sampling assembly is used with no need for any additional device, thus making it easy to operate and carry.


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