The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2011
Filed:
Jul. 23, 2008
Applicants:
Nasr A. Shuaib, Lexington, KY (US);
Marwan K. Khraisheh, Lexington, KY (US);
Inventors:
Nasr A. Shuaib, Lexington, KY (US);
Marwan K. Khraisheh, Lexington, KY (US);
Assignee:
University of Kentucky Research Foundation, Lexington, KY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 19/08 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of predicting sheet formability at a microscale level includes the steps of providing a grid pattern on a test sheet, bulging the test sheet to a hemispherical shape until a crack is initiated on the surface of the test sheet, detecting the initiation of the crack, acquiring two images of the surface adjacent to the crack and calculating surface strains on the test sheet.
Shuaib, Nasr. (2011). Method and apparatus for characterizing microscale formability of thin sheet materials (U.S. Patent No. 8042405). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8042405
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile