The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2011
Filed:
Jun. 11, 2008
Yu Seung MA, Daejeon, KR;
Duk Kyun Woo, Daejeon, KR;
Yu Seung Ma, Daejeon, KR;
Duk Kyun Woo, Daejeon, KR;
Electronics and Telecommunications Research Insitute, Daejeon, KR;
Abstract
Provided are a method and apparatus for evaluating the effectiveness of a test case used for a program test on the basis of error detection capability. The method includes: receiving a target program used for evaluating the effectiveness of the test case; generating an error program by inputting errors to the target program; detecting the errors by executing the test case on the generated error program; and calculating evaluation points of the test case using a ratio of the number of the detected errors to the number of the input errors. Thus, the capability of the test case used for a program test to detect errors can be evaluated.