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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8041549 B1

PDFFull Text
Expired
Date of Patent:
Oct. 18, 2011

Filed:

Jan. 28, 2008

Analyzation apparatus and control method thereof

Applicants:

Dai Matsumura, Kawasaki, JP;

Yasuo Katano, Kawasaki, JP;

Inventors:

Dai Matsumura, Kawasaki, JP;

Yasuo Katano, Kawasaki, JP;

Assignee:

Canon Kabushiki Kaisha, Tokyo, JP;

Attorney:

Cowan, Liebowitz & Latman, P.C.

Primary Examiner:

Kamini S Shah

Assistant Examiner:

Suzanne Lo

Int. Cl.
CPC ...
G06F 17/10 (2006.01); G06F 17/11 (2006.01); G06G 7/48 (2006.01); G06G 7/68 (2006.01); G06T 17/00 (2006.01); G06T 17/10 (2006.01); G09G 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An analyzation apparatus which performs an analysis simulation in accordance with analysis condition data. An analysis condition modeling unit generates an analysis condition model data by assigning an analysis condition to each region of a three-dimensional model represented with analysis object model data of the analysis simulation based on analysis condition data set for the analysis simulation. A rendering unit renders the three-dimensional model represented with the analysis condition model data and displays the three-dimensional model on a display device.

Find Patent Forward Citations

Matsumura, Dai. (2011). Analyzation apparatus and control method thereof (U.S. Patent No. 8041549). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8041549

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