The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2011
Filed:
Jan. 28, 2008
Applicant:
Katsuhiko Iwazaki, Aichi, JP;
Inventor:
Katsuhiko Iwazaki, Aichi, JP;
Assignee:
Toyota Jidosha Kabushiki Kaisha, Toyota, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05D 1/08 (2006.01); B60G 17/005 (2006.01);
U.S. Cl.
CPC ...
Abstract
A future yaw rate γ(t) is estimated according to a current yaw rate γ(t) and a steering angular velocity. As compared with directly detecting the yaw rate γ(t) from a vehicle body, calculating the yaw rate γ(t) from a steering operation can attain a yaw rate having a phase advanced by a time lag Δt, whereby the future yaw rate γ(t) can be estimated accurately.
Iwazaki, Katsuhiko. (2011). Apparatus for estimating yaw rate (U.S. Patent No. 8041480). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8041480
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile