The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2011

Filed:

Sep. 21, 2004
Applicants:

Devang K. Naik, San Jose, CA (US);

Kim E. A. Silverman, Mountain View, CA (US);

Inventors:

Devang K. Naik, San Jose, CA (US);

Kim E. A. Silverman, Mountain View, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/34 (2006.01); G06K 9/72 (2006.01); G06F 17/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, apparatus, and system, for scanning a first portion of a data to generate a second portion of data is provided. A control parameter relating to a level of detail associated with filtering a first portion of data is received. The filtering of the first portion of data is performed based upon the control parameter. The filtering of the first portion of data includes a rule-based filtering, a context-based filtering, a statistical-based filtering, or a semantic-based filtering. Performing the filtering provides for a reduction of a portion of the first portion of data. A second portion of data that is smaller than the first portion of data is provided based upon the filtering of the first portion of data.


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