The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2011
Filed:
Apr. 22, 2008
Applicants:
Philipp Bernhardt, Forchheim, DE;
Ernst-peter Rührnschopf, Erlangen, DE;
Inventors:
Philipp Bernhardt, Forchheim, DE;
Ernst-Peter Rührnschopf, Erlangen, DE;
Assignee:
Siemens Aktiengesellschaft, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention relates to a method for creating scatter-corrected mass density image in dual energy X-ray absorptiometry. The mass density image is created using additional information provided by attenuation images at different energy levels in an inhomogeneous correction image area. A multi-dimensional mass density is found that is consistent for a plurality of the attenuation images by inverting a primary radiation function. A scatter fraction is determined on the basis of the multi-dimensional mass density.