The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2011

Filed:

Oct. 27, 2009
Applicants:

Takeshi Endo, Osaka, JP;

Hiroshi Hatano, Takatsuki, JP;

Tetsuya Noda, Tenri, JP;

Kazutaka Noguchi, Hachioji, JP;

Hiroyuki Matsuda, Yokohama, JP;

Shigeru Yamasaki, Saitama, JP;

Inventors:

Takeshi Endo, Osaka, JP;

Hiroshi Hatano, Takatsuki, JP;

Tetsuya Noda, Tenri, JP;

Kazutaka Noguchi, Hachioji, JP;

Hiroyuki Matsuda, Yokohama, JP;

Shigeru Yamasaki, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical information recording and reproducing apparatus relating to the invention employs a two-beam interference method. In the optical information recording and reproducing apparatus, a moving device moves an information recording medium between a recording and reproducing position and a retracting position, and a mirror moves together with the information recording medium. When the information recording medium moves to the recording and reproducing position, the mirror moves to a position which is displaced from the at least one of the reference beam and the information beam. When the information recording medium moves to the retracting position, the mirror moves to a position where the mirror can reflect the at least one of the reference beam and the information beam toward a detector for detecting a deviation of the at least one of the reference beam and the information beam.


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