The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2011
Filed:
Aug. 29, 2008
Conor L. Evans, Boston, MA (US);
Johannes F. DE Boer, Amstelveen, NL;
Mattijs DE Groot, Haarlem, NL;
Conor L. Evans, Boston, MA (US);
Johannes F. De Boer, Amstelveen, NL;
Mattijs De Groot, Haarlem, NL;
The General Hospital Corporation, Boston, MA (US);
Abstract
Exemplary apparatus and/or method can be provided using which, it is possible to provide information associated with at least one portion of a sample. For example, at least one electro-magnetic radiation received from the at least one portion of the sample can be separated into a plurality of first radiations, one of the first radiations having a phase delay that is different from a phase delay of another of the first radiations. In addition, at least one of the first radiations can be received and separated into second radiations according to wavelengths of the received at least one of the first radiations. Further, it is possible to detect the second radiations and generate information regarding a position of the at least one portion of the sample as a function of at least one characteristic of at least one interference of the first radiations. According to another exemplary embodiment, it is possible to provide system, method and computer accessible medium, in which data associated with first radiations can be obtained, and the information regarding a position of the at least one portion of the sample may be generated. Such information can be generated based on the data by separating second radiations associated with the portion(s) of the sample according to wavelengths of at least one of the second radiations. For example, one of the second radiations can have a phase delay that is different from a phase delay of another one of the second radiations, and the second radiations may be interfering.