The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2011

Filed:

Jan. 28, 2008
Applicants:

Martin Kunz, München, DE;

Anton Schick, Velden, DE;

Michael Stockmann, Bruckmühl, DE;

Inventors:

Martin Kunz, München, DE;

Anton Schick, Velden, DE;

Michael Stockmann, Bruckmühl, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention describes an optical deflection element for the refractive production of a spatially structured bundle of light beams fanned concentrically to an optical axis of the deflection element. The optical deflection element has a base body made of optically transparent material, and has a light input and output side. The light input side is configured such that a primary bundle of light beams can be coupled in the base body. The light output side has a cylindrically symmetrical contour, which defines a recess in the base body. The fanning of the primary bundle of light beams is achieved by refraction on rotationally symmetric interfaces, which are variably inclined relative to the optical axis. The invention further relates to an optical measuring device for the three-dimensional measurement of a cavity in an object and a method for producing a concentrically fanned, spatially structured bundle of light beams.


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