The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2011
Filed:
Jun. 18, 2008
Rainer Uhl, Graefelfing, DE;
Rainer Uhl, Graefelfing, DE;
TILL I.D. GmbH, Graefelfing, DE;
Ludwigs-Maximilians-Universitaet Muenchen, Munich, DE;
Abstract
There is provided a microscope device comprising: means for creating a collimated beam of light collected from a sample and comprising at least a first spectral range and a second spectral range, means for separating the collimated beam into a first beam containing a higher percentage of light of the first spectral range than light of the second spectral range and a second beam containing a lower percentage of light of the first spectral range than light of the second spectral range, means for reflecting the first beam, means for reflecting the second beam, means for combining the first beam and the second beam, a detector, and means for imaging the combined first and second beam onto the detector in order to create an image of the sample on the detector, wherein the means for reflecting the first beam and the means for reflecting the second beam are arranged in such a manner that the image created by the first beam and the image created by the second beam are shifted relative to each other on the detector, wherein the means for reflecting the first beam is adapted to invert handedness of the first beam, and wherein the means for reflecting the second beam is adapted to preserve handedness of the second beam.