The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2011
Filed:
Nov. 06, 2006
Eugen Ermantraut, Jena, DE;
Ralf Bickel, Jena, DE;
Torsten Schulz, Jena, DE;
Thomas Ullrich, Jena, DE;
Jens Tuchscheerer, Jena, DE;
Eugen Ermantraut, Jena, DE;
Ralf Bickel, Jena, DE;
Torsten Schulz, Jena, DE;
Thomas Ullrich, Jena, DE;
Jens Tuchscheerer, Jena, DE;
Clondiag GmbH, Jena, DE;
Abstract
The present invention relates to devices and methods for the qualitative and/or quantitative detection of particles. In particular, the invention relates to devices for the detection of particles, comprising a reaction chamber formed within a chamber body between a first surface and a second surface, wherein the second surface is located opposite to the first surface, and one or more displacers, wherein the distance between the first surface and the second surface is variable via the one or more displacers at least in one or more parts of the surface area of the first surface and/or the second surface. The invention also relates to corresponding methods for the detection of particles, comprising positioning a sample supposed to comprise one or more species of particles to be detected in a reaction chamber, displacing at least a part of the sample within the reaction chamber via the one or more displacers; and detecting/determining a value indicative for the presence and/or number of one or more species of particles.