The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2011

Filed:

Aug. 09, 2006
Applicants:

Tetsuro Yamazaki, Suwa, JP;

Takashi Takeda, Suwa, JP;

Daisuke Uchikawa, Matsumoto, JP;

Yasunaga Miyazawa, Okaya, JP;

Inventors:

Tetsuro Yamazaki, Suwa, JP;

Takashi Takeda, Suwa, JP;

Daisuke Uchikawa, Matsumoto, JP;

Yasunaga Miyazawa, Okaya, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/038 (2006.01); G09G 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A light scan device which forces a beam light depending on an image signal to scan, including: a light source part for supplying the beam light; and a scanning part for forcing the beam light from the light source part to scan an illumination-target region in a first direction and a second direction substantially orthogonal to the first direction, wherein the scanning part is driven so that a frequency with which the beam light is forced to scan in the first direction is higher than a frequency with which the beam light is forced to scan in the second direction, and a spot formed on the illumination-target region by the beam light has a form with a shorter size in the first direction than in the second direction.


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