The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2011

Filed:

Feb. 26, 2009
Applicants:

Naresh Kesavan Rao, Clifton Park, NY (US);

Richard Gordon Cronce, New Berlin, WI (US);

Jianjun Guo, Ballston Spa, NY (US);

Inventors:

Naresh Kesavan Rao, Clifton Park, NY (US);

Richard Gordon Cronce, New Berlin, WI (US);

Jianjun Guo, Ballston Spa, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to embodiments of the present technique, a system and a method for obtaining low-noise measurements for a wide range of analog signal strengths is provided. According to aspects of the present technique, a low-gain measurement of an input pixel charge is performed, wherein the input pixel charge is distributed to two feedback capacitors, which together provide a relatively low integrator gain. After the low-gain measurement, a high-gain measurement is performed, wherein one of the capacitors is remove from the feedback loop and the charge is redistributed to the remaining capacitor.


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