The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2011
Filed:
Jul. 01, 2008
David Ernest Call, Folsom, CA (US);
Ciaran Avram Fox, Sunnyvale, CA (US);
Jih-shiuan Luo, San Jose, CA (US);
Robert Langland Smith, Sunnyvale, CA (US);
Chin-yu Yeh, San Jose, CA (US);
David Ernest Call, Folsom, CA (US);
Ciaran Avram Fox, Sunnyvale, CA (US);
Jih-Shiuan Luo, San Jose, CA (US);
Robert Langland Smith, Sunnyvale, CA (US);
Chin-Yu Yeh, San Jose, CA (US);
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Abstract
A method for testing a magnetic head to determine whether the magnetic head is unacceptably affected by temperature variations. The test includes testing the magnetic head at different temperatures and measuring either or both of a signal amplitude and a signal asymmetry of a signal from the magnetic head at the different temperatures. If signal amplitude or signal asymmetry vary excessively as a result of the temperature change then the head can be scrapped.