The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2011
Filed:
Jan. 18, 2008
Applicant:
Takeshi Nakata, Tokyo, JP;
Inventor:
Takeshi Nakata, Tokyo, JP;
Assignee:
NEC Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A semiconductor photo detector is provided that includes a layer structure deposited over a semiconductor substrate, and having a second mesa formed on the semiconductor substrate and a first mesa formed on the second mesa, wherein an outer periphery of the second mesa is located outside of the outer periphery of the first mesa in two-dimensional view, and wherein surfaces of the first mesa and the second mesa are covered by a passivation film.
Nakata, Takeshi. (2011). Semiconductor photo detector (U.S. Patent No. 8039918). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8039918
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile