The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2011

Filed:

Apr. 22, 2010
Applicants:

Eric Pearson, Consestogo, CA;

Mark R. Hansen, Wauwatosa, WI (US);

Bradly S. Moersfelder, Waukesha, WI (US);

Patrick James Noffke, Devon Park, AU;

John C. Seymour, Genesee Depot, WI (US);

Inventors:

Eric Pearson, Consestogo, CA;

Mark R. Hansen, Wauwatosa, WI (US);

Bradly S. Moersfelder, Waukesha, WI (US);

Patrick James Noffke, Devon Park, AU;

John C. Seymour, Genesee Depot, WI (US);

Assignee:

Quad/Tech, Inc., Sussex, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/86 (2006.01); G01V 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of inspecting an imprinted substrate on a printing press comprises illuminating a portion of the substrate which has been imprinted with different colors at a plurality of printing units of the printing press. The method further comprises sensing light reflected by the substrate using a contact image sensor to produce data representative of the imprinted substrate, and comparing the data representative of the printed substrate with stored reference data.


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