The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2011
Filed:
Apr. 13, 2010
Michael Crocker, Endwell, NY (US);
Liza Hart, Nichols, NY (US);
Eric Johnson, Greene, NY (US);
Gerald Kiballa, Owego, NY (US);
Michael Crocker, Endwell, NY (US);
Liza Hart, Nichols, NY (US);
Eric Johnson, Greene, NY (US);
Gerald Kiballa, Owego, NY (US);
SureScan Corporation, Endicott, NY (US);
Abstract
A method and device that provides independent temperature control of x-ray detector crystals, either singly or in small groups. In addition to a thermal control network for the crystals, electronic devices are associated with each detector crystal and are independently cooled using Peltier devices so that lifetime and reliability are maximized. In most operating environments the ambient temperature is less than the operating temperature of the detector crystals. In these situations, the heat removed from the electronics can be used to heat the detector crystals, resulting in efficient operation.