The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2011
Filed:
Feb. 16, 2009
Kejun Kang, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
LI Zhang, Beijing, CN;
Yingxin Wang, Beijing, CN;
Ziran Zhao, Beijing, CN;
Yuanjing LI, Beijing, CN;
Yinong Liu, Beijing, CN;
Zhifeng Huang, Beijing, CN;
Yuxiang Xing, Beijing, CN;
Kejun Kang, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Li Zhang, Beijing, CN;
Yingxin Wang, Beijing, CN;
Ziran Zhao, Beijing, CN;
Yuanjing Li, Beijing, CN;
Yinong Liu, Beijing, CN;
Zhifeng Huang, Beijing, CN;
Yuxiang Xing, Beijing, CN;
Tsinghua University, et al., Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Abstract
A method for phase contrast imaging comprises: illuminating an object by terahertz radiation such that the terahertz radiation interacts with the object; illuminating a diffraction grating by the terahertz radiation that has interacted with the object; translating the diffraction grating along the direction of the grating wave vector, to measure, for each of different grating positions, an intensity distribution of the terahertz radiation that has interacted with the object and with the grating in a diffraction field; and retrieving a phase contrast image of the object from the intensity distributions. An apparatus for phase contrast imaging is also provided.