The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2011
Filed:
Mar. 19, 2010
Gerd Benner, Aalen, DE;
Marko Matijevic, Nürtingen, DE;
Gerd Benner, Aalen, DE;
Marko Matijevic, Nürtingen, DE;
Carl Zeizz NTS GmbH, Oberkochen, DE;
Abstract
A phase contrast electron microscope has an objective () with a back focal plane (), a first diffraction lens (), which images the back focal plane () of the objective () magnified into a diffraction intermediate image plane, a second diffraction lens () whose principal plane is mounted in the proximity of the diffraction intermediate image plane and a phase-shifting element () which is mounted in or in the proximity of the diffraction intermediate image plane. Also, a phase contrast electron microscope has an objective () having a back focal plane (), a first diffraction lens (), a first phase-shifting element and a second phase-shifting element which is mounted in or in the proximity of the diffraction intermediate image plane. The first diffraction lens () images the back focal plane of the objective magnified into a diffraction intermediate image plane and the first phase-shifting element is mounted in the back focal plane () of the objective (). With the magnified imaging of the diffraction plane by the diffraction lens, the dimensional requirements imposed on the phase plate having the phase-shifting element are reduced.