The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2011
Filed:
May. 04, 2009
Xiquan Cui, Pasadena, CA (US);
Changhuei Yang, Pasadena, CA (US);
Guillermo J. Tearney, Cambridge, MA (US);
Xiquan Cui, Pasadena, CA (US);
Changhuei Yang, Pasadena, CA (US);
Guillermo J. Tearney, Cambridge, MA (US);
California Institute of Technology, Pasadena, CA (US);
The General Hospital Corporation, Cambridge, MA (US);
Abstract
A wavefront microscope or camera utilizes a wavefront sensor to measure the local intensity and phase gradient of the wavefront and output image maps based on the intensity and phase gradient. A wavefront sensor provides a metal film having patterned structured two dimensional (2D) apertures that convert a phase gradient of a wavefront into a measurable form onto a photodetector array. A computer is used to analyze the data by separating signals projected and recorded on the array from the different apertures, predict a center of each projection, and sum signals for each projection to display the intensity while determining a center position change/offset from the predicted center to display the phase gradient of the wavefront.