The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2011

Filed:

Apr. 14, 2009
Applicants:

Karl Erhard Thiele, Andover, MA (US);

Rodney J. Solomon, Andover, MA (US);

George Adleman, Arlington, MA (US);

Bernard Savord, Andover, MA (US);

Inventors:

Karl Erhard Thiele, Andover, MA (US);

Rodney J. Solomon, Andover, MA (US);

George Adleman, Arlington, MA (US);

Bernard Savord, Andover, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An ultrasound-imaging system and method is provided that permits an operator to acquire an image of a volume-of-interest in a time critical fashion, that is capable of referencing the volume rendering to a standard two-dimensional imaging mode, and permits the operator to selectively choose a number of display-mode parameters that result in an operator directed view of the volume-of-interest. The ultrasound-imaging system comprises an input device configured to receive a plurality of imaging parameters and a controller in communication with the input device. The ultrasound-imaging system generates an operator-directed transmit-beam scan sequence in response to the imaging parameters and transmits a spatially modified transmit-beam scan sequence over a portion of the volume-scan range of the ultrasound-imaging system. Moreover, the ultrasound-imaging system provides the flexibility for an operator to direct a plurality of operator-configurable multi-dimensional views.


Find Patent Forward Citations

Loading…