The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2011
Filed:
Apr. 12, 2008
Applicants:
Samuel D. Fink, Aiken, SC (US);
Fernando F. Fondeur, North Augusta, SC (US);
Inventors:
Samuel D. Fink, Aiken, SC (US);
Fernando F. Fondeur, North Augusta, SC (US);
Assignee:
Savannah River Nuclear Solutions, LLC, Aiken, SC (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 5/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
An atomic force microscope is provided that includes a micro thermal analyzer with a tip. The micro thermal analyzer is configured for obtaining topographical data from a sample. A raman spectrometer is included and is configured for use in obtaining chemical data from the sample.
Fink, Samuel. (2011). Atomic force microscope with combined ftir-raman spectroscopy having a micro thermal analyzer (U.S. Patent No. 8037945). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8037945
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile