The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2011
Filed:
Jun. 27, 2008
Martin Gutfleisch, Dossenheim, DE;
Axel Hauck, Karlsruhe, DE;
Martin Gutfleisch, Dossenheim, DE;
Axel Hauck, Karlsruhe, DE;
Heidelberger Druckmaschinen AG, Heidelberg, DE;
Abstract
A measurement field allows determining the smearing limit during printing, in particular during lithographic wet offset printing. The measurement field is arranged on a printing form, in particular a printing plate, which has printing, ink-carrying regions and nonprinting, dampening solution-carrying regions on its surface. A dampening solution-carrying property in the region of the measurement field is reduced by a nanoscopic coating (e.g., with amphiphilic molecules) or an unscreened, microscopic coating (e.g., a polymer coating) in comparison with the dampening solution-carrying property in the nonprinting regions of the surface of the printing form. The nanoscopic coating or the microscopic coating advantageously leads to a shifting of the smearing limit, that is to say to a displacement of the starting point of scumming, by the dampening solution requirement which is increased for scum-free printing within the region of the measurement field. Such a measurement field is thus advantageously used for the closed-loop control of a dampening solution supply.