The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2011
Filed:
Oct. 29, 2008
Cheng-yung Teng, Taipei County, TW;
Yi-chang Hsu, Taipei County, TW;
Jie-wei Huang, Taipei County, TW;
Cheng-Yung Teng, Taipei County, TW;
Yi-Chang Hsu, Taipei County, TW;
Jie-Wei Huang, Taipei County, TW;
Princeton Technology Corporation, Hsin Tien, Taipei County, TW;
Abstract
A test system for testing a plurality of devices under test is disclosed. The test system includes a tester and a plurality of processors. The tester is used for providing a plurality of control signals and determining a plurality of test results for the devices under test according to a plurality of measurement results. Each processor coupled to the tester is used for generating a plurality of test signals according to the plurality of control signals. The plurality of devices under test respectively generates the plurality of test results according to the plurality of test signals.