The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2011

Filed:

Sep. 16, 2004
Applicants:

Tarun Kumar, Ossining, NY (US);

Gyana R. Parija, Poughkeepsie, NY (US);

Haifeng Xi, Yorktown Heights, NY (US);

Inventors:

Tarun Kumar, Ossining, NY (US);

Gyana R. Parija, Poughkeepsie, NY (US);

Haifeng Xi, Yorktown Heights, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method (and system) of providing optimization repeatability in an on-demand computing environment removes variability in an optimization model instance and can be exemplarily implemented in a service architecture. The method and system receives a plurality of physical data instances, which are different representations of the same logical data model, and transforms the plurality of physical data instances into a normalized physical data instance, which can be combined with an optimization model to form a unique optimization model instance, thereby providing repeatability in solving optimization problems.


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