The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2011
Filed:
Dec. 22, 2006
Todd O. Dampier, Mountain View, CA (US);
Todd O. Dampier, Mountain View, CA (US);
Merced Systems, Inc., Redwood Shores, CA (US);
Abstract
Each of a plurality of dimension coordinates corresponding to a report query has a finer grain and a coarser grain. A subset of the dimension coordinates are dimension coordinates for which there is ambiguity as to what coarser grain value should be associated with the finer grain value. For every unique finer grain value of the dimension coordinates of the subset, it is determined what coarser grain value to associate with all dimension coordinates of the subset having that finer grain value. The determined coarser grain value is the coarser grain value of one of the dimension coordinates, of the subset, having that finer grain value. For each of the dimension coordinates of the plurality of dimension coordinates not in the subset, the coarser grain value associated with that dimension coordinate is the coarser grain value of that dimension coordinate. A report is generated in view of the plurality of dimension coordinates and their associated coarser grain values.