The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2011
Filed:
Dec. 12, 2008
Changlin Wang, Shanghai, CN;
Changlin Wang, Shanghai, CN;
Mettler-Toledo AG, Greifensee, CH;
Abstract
A method and device are disclosed for measuring potentiometric measuring probes. An exemplary method includes feeding two test voltages comprising a harmonic wave Uwith a base frequency fand the harmonic wave Uwith a base frequency finto two cores of a connecting cable through voltage source impedances, respectively. The voltage between an indicating electrode and a reference electrode, and the AC responding signal resulting from the two test voltages are passed to an amplifier and further to a transfer function unit having transfer functions (H, H), an A/D converter, and a Fourier transformation unit, to calculate a potential Uand the two test responses Uand U, respectively. Two calibration responses Uand Uare determined, wherein Uincludes a product of Uand H, and wherein Uincludes a product of Uand H. Functional expressions are established for the test responses Uand U, and the internal resistances Rand Rare determined by simultaneously solving equations having the unknown resistances Rand Rand capacitances Cand C. Accurate measurement of the internal resistance of the electrode can be achieved even with a relatively long connecting cable.