The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2011
Filed:
Feb. 13, 2007
Applicant:
Ikuo Hayaishi, Matsumoto, JP;
Inventor:
Ikuo Hayaishi, Matsumoto, JP;
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
It is received first image data described on the basis of a first color space. It is acquired color space converting information adapted to be used to convert the first image data into second image data described on the basis of a prescribed second color space. The first image data is converted into the second image data in accordance with the color space converting information. A prescribed feature quantity is extracted from the second image data.
Hayaishi, Ikuo. (2011). Method and apparatus of analyzing and generating image data (U.S. Patent No. 8036455). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8036455
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